Circuit performance degradation on FPGAs considering NBTI and process variations
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چکیده
LSI scaling causes the reliability problem. It is important to analyze the degradation of Negative Bias Temperature Instability(NBTI) in circuit designs. Yield is affected by variations. In the near future, NBTI and variations will decrease reliability on FPGAs fabricated in a nanometer process. In this work, we show the effect of NBTI and variations on 65nm FPGAs. According to our results, cicuit design margin can be reduced.
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تاریخ انتشار 2010